| Tuesday |
| Tue. |
9:30 |
Prediction of RF Breakdown in Combline Filters with FEST3D |
| |
|
F. J. Pérez, J. Gil, C. Vicente, V. E. Boria, Aurorasat, contact@aurorasat.es |
| Tue. |
9:50 |
Practical Methods for Estimating the Q of Spiral Inductors Using EM Planar Simulators |
| |
|
John Dunn, Charlotte Blair, AWR, jdunn@awrcorp.com, charlotte@awrcorp.com |
| Tue. |
10:10 |
Tools for Creating FET and MMIC Thermal Profiles |
| |
|
Ted Miracco, John Fiala, AWR, CapeSym, miracco@awrcorp.com, fiala@capesim.com |
| Tue. |
10:30 |
Applications and Techniques for Low Phase Noise Signal Generation |
| |
|
John Hansen, Agilent, john_s_hansen@agilent.com |
| Tue. |
10:50 |
Understanding Contributors to Test Time for VSA Measurements |
| |
|
David Hall, National Instruments, david.hall@ni.com |
| Tue. |
11:10 |
Techniques for Validating a Vector Network Analyzer Calibration When Using Microwave Probes |
| |
|
Craig Kirkpatrick, Cascade Microtech, craig.kirkpatrick@cmicro.com |
| Tue. |
11:30 |
Ultra Low Phase Noise Measurement Technique Using Innovative Optical Delay Lines |
| |
|
Guillaume De Giovanni, NoiseXT, guillaume.degiovanni@noisext.com |
| Tue. |
11:50 |
A Multi-Level Conductor Surface Roughness Model |
| |
|
Yunhui Chu, Agilent, yunhui_chu@agilent.com |
| Tue. |
12:10 |
Understanding the Proper Dielectric Constant of High Frequency Laminates to Be Used for Circuit Modeling and Design |
| |
|
John Coonrod, Allen F. Horn , Rogers, John.coonrod@rogerscorp.com, Al.horn@rogerscorp.com |
| Tue. |
12:30 |
Volume Manufacturing Trends for Automotive Radar Devices |
| |
|
Jake Sanderson, Agilent, jake.sanderson@agilent.com |
| Tue. |
12:50 |
Improved Soldering Techniques for Cylindrical RF Connectors Using HIG Induction Technology |
| |
|
Chip Palombini, iTherm, Jpalombini@itherm.com |
| Tue. |
13:10 |
Power Amplifier Design Utilizing the NVNA and X-Parameters |
| |
|
Loren Betts, Dylan T. Bespalko, Slim Boumaiza, Agilent, University of Waterloo, loren_betts@agilent.com |
| Tue. |
13:30 |
Wideband Direct Digital Radio Modeling and Verification |
| |
|
David Leiss, Rulon VanDyke, Agilent, david_leiss@agilent.com, rulon_vandyke@agilent.com |
| Tue. |
13:50 |
Improved Microwave Device Characterization and Qualification Using Affordable Microwave Microprobing Techniques for High-Yield Production of Microwave Components |
| |
|
Gregory Mau, Jerry Schappacher, Custom Microwave Components, J micro Technology, greg@customwave.com, jerry@jmicrotechnology.com |
| Tue. |
14:10 |
Time Domain Measurements in Waveguide |
| |
|
Keith Anderson, Agilent, keithf_anderson@agilent.com |
| Tue. |
14:30 |
Pulsed S-Parameter Measurements Using PXI Instruments |
| |
|
David Broadbent, National Instruments, david.broadbent@ni.com |
| Tue. |
14:50 |
Emergence of the Online Design Center |
| |
|
Sherry Hess, Dave Kuhn, AWR, Transim Technology Corporation, hess@awrcorp.com, dkuhn@transim.com |
| Tue. |
15:10 |
Design for Manufacturing: Yield Analysis During EM Simulation |
| |
|
Mark Saffian, AWR, mark.saffian@awrcorp.com |
| Tue. |
15:30 |
STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits |
| |
|
Stéphane Dellier, AMCAD Engineering, dellier@amcad-engineering.fr |
| Tue. |
15:50 |
Maximizing VSA Dynamic Range Through Appropriate IF Path Selection |
| |
|
Raajit Lall, National Instruments, raajit.lall@ni.com |
| Tue. |
16:10 |
Waveguide Characteristics and Measurement Errors |
| |
|
Keith Anderson, Agilent, keithf_anderson@agilent.com |
| Tue. |
16:30 |
Memory Effects in RF Circuits: Definition, Manifestations and Fast, Accurate Simulation |
| |
|
George Estep, Arnaud Soury, Agilent, george_estep@agilent.com, arnaud_soury@agilent.com |
| Wednesday |
| Wed. |
9:30 |
Fast and Accurate CAD Solutions for Passive Waveguide Components and Horn Antenna Feed Systems with the μWave Wizard |
| |
|
Ralf Beyer, Mician, beyer@mician.com |
| Wed. |
9:50 |
Customized, Deembedded Ports in 3D Planar EM Tools: Extending Deembedding to Arbitrary Geometries |
| |
|
John Dunn, AWR, jdunn@awrcorp.com |
| Wed. |
10:10 |
SEMCAD X Microwave: Enhanced Simulation of Waveguide Structures |
| |
|
Erdem Ofli, Pedro Crespo-Valero, Jorge Ruiz-Cruz, SPEAG, UAM, ofli@speag.com |
| Wed. |
10:30 |
Using X-Parameters to Optimize Notch Filter Placement in PA |
| |
|
George Crumrine, Agilent, george_crumrine@agilent.com |
| Wed. |
10:50 |
IQ Mixer Measurements: Techniques for Complete Characterization of IQ Mixers Using a Multi-Port Vector Network Analyzer |
| |
|
Dara Sariaslani, Agilent, dara_sariaslani@agilent.com |
| Wed. |
11:10 |
pHEMT Amplifier MMICs with Enhanced Robustness Against Process Variations |
| |
|
Charles Trantanella, David Folding, Custom MMIC Design Services, tranti@custommmic.com, davef@custommmic.com |
| Wed. |
11:30 |
Design Benefits of Integrating Simulation and Measurement Environments: An LNA Example |
| |
|
Gary Wray, AWR, gwray@awrcorp.com |
| Wed. |
12:00 |
Panel Session: Nonlinear Measurements (12:00 to 13:30) |
| Wed. |
13:50 |
Simulation and Evaluation of Communications Systems in Conformance With Third- and Fourth-Generation Wireless Standards |
| |
|
Joel Kirshman, AWR, joel@awrcorp.com |
| Wed. |
14:10 |
Remcom's XFdtd and Wireless InSite: Advanced Tools for Advanced Communication Systems Analysis |
| |
|
Joseph J. Rokita, Kyle Labowski, Remcom, Joseph.Rokita@remcom.com, Kyle.Labowski@remcom.com |
| Wed. |
14:30 |
Digital Radio Testing Using an RF Channel Replicator |
| |
|
Joe Mazzochette, EOX, joem@eastern-optx.com |
| Wed. |
14:50 |
Advanced Terahertz Device Characterization |
| |
|
Keith Anderson, Agilent, keithf_anderson@agilent.com |
| Wed. |
15:10 |
High Performance RF Photonic Link Technologies |
| |
|
Dalma Novak, Pharad, dnovak@pharad.com |
| Wed. |
15:30 |
A Practical Approach to Verifying RFICs with Fast Mismatch Analysis |
| |
|
George Estep, Paul Colestock, Agilent, george_estep@agilent.com, paul_colestock@agilent.com |
| Wed. |
15:50 |
Calibration and Accuracy in Millimeter Systems |
| |
|
Keith Anderson, Agilent, keithf_anderson@agilent.com |
| Wed. |
16:10 |
Instant RF Design Starts with Simulate-able RF Application Notes |
| |
|
How-Siang Yap, Mike Virostko, Agilent, Hittite, how-siang_yap@agilent.com, michael.virostko@hittite.com |
| Wed. |
16:30 |
New Rotary Joint Product Lines for SATCOM Applications |
| |
|
Andreas Lermann, SPINNER, Andreas.lermann@spinner-group.com |
| Wed. |
17:00 |
CANCELLED Keynote Address: What Makes Successful Mergers? (5:00 to 6:00) |
| |
|
John Ocampo, M/A-COM Technology Solutions, Inc. |
| Thursday |
| Thu. |
9:10 |
System-Level Simulation in the Design of Advanced Radar Systems |
| |
|
Joel Kirshman, AWR, joel@awrcorp.com |
| Thu. |
9:30 |
The Art of Benchmarking RF Test Time |
| |
|
David Hall, National Instruments, david.hall@ni.com |
| Thu. |
9:50 |
The Alphabet Soup of Vector Network Analyzer Calibration |
| |
|
Craig Kirkpatrick, Cascade Microtech, craig.kirkpatrick@cmicro.com |
| Thu. |
10:10 |
Advances in Signal Analyzer Noise Floor and Dynamic Range |
| |
|
John Hansen, Agilent, john_s_hansen@agilent.com |
| Thu. |
10:30 |
Easy, Fast and Versatile Time Domain Waveform Measurement of Microwave Power Transistors |
| |
|
Fabien De Groote, Jan Verspecht, Jean-Pierre Teyssier, Jad Faraj, Verspecht-Teyssier-DeGroote, fabien.degroote@vtd-rf.com |
| Thu. |
10:50 |
EMPIRE XCcel – Efficient Solving of Large Scale EM Problems |
| |
|
A. Lauer, W. Simon, A. Wien, EMPIRE XCcel, lauer@imst.de |
| Thu. |
11:10 |
Transient FEM Solver and Hybrid FE-IE Method; New Technologies in HFSS 13.0 |
| |
|
Matthew H. Commens, ANSYS, matt.commens@ansys.com |
| Thu. |
11:30 |
QuickWave Electromagnetic Software with CAD Input and GPU Processing |
| |
|
Malgorzata Celuch, Maciej Sypniewski, QWED, mceluch@qwed.eu |
| Thu. |
11:50 |
Application Principles for Circulators and Isolators |
| |
|
Anthony Edridge, Gene Garcia, M2 Global, tedridge@m2global.com, ggarcia@m2global.com |
| Thu. |
12:10 |
The Design and Test of Broadband Launches Up to 50 GHz on Thin and Thick Substrates |
| |
|
Bill Rossas, Southwest Microwave, billr@southwestmicrowave.com |
| Thu. |
12:30 |
Low-PIM Filter Solutions for Broadband Emission Monitoring |
| |
|
Rafi Hershtig, Tim Dolan, K&L Microwave, Rhershtig@klmicrowave.com, Tdolan@klmicrowave.com |
| Thu. |
12:50 |
Mixed-Signal Active Load Pull – The Fast Track to 3G/4G Amplifier Design |
| |
|
Mauro Marchetti, Maury Microwave, mauro@anteverta-mw.com |
| Thu. |
13:10 |
A Comparison of Noise Parameter Measurement Techniques |
| |
|
Erick Kueckels, Maury Microwave, ekueckels@maurymw.com |
| Thu. |
13:30 |
Vector-Receiver Load Pull – Measurement Accuracy at its Best |
| |
|
Steve Dudkiewicz, Maury Microwave, sdudkiewicz@maurymw.com |
| Thu. |
13:50 |
Active and Hybrid Load Pull – A Paradigm Shift |
| |
|
Gary Simpson, Maury Microwave, gsimpson@maurymw.com |
| Thu. |
14:10 |
Local Fundamental Frequency Enhancements for X-Parameter Models |
| |
|
Radek Biernacki, Mihai Marcu, Agilent, Radek_Biernacki@agilent.com , Mihai_Marcu@agilent.com |
| Thu. |
14:30 |
Beyond the S-Parameter: The Benefits of Nonlinear Device Models |
| |
|
Mike Heimlich, AWR, mike@awrcorp.com |
