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MicroApps Call for Seminar Proposals
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Microwave Applications Seminar Call for Presentations: The Microwave Application Seminars (MicroApps) at the IEEE MTT-S International Microwave Symposium 2011 (IMS2011) will be presented in
Baltimore, Maryland, from Tuesday, June 7 through Thursday, June 9, 2011. Exhibitors at the Symposium are invited to submit applications
engineering technical seminars describing state-of-the-art products and processes of interest to the microwave community, to be
considered for oral presentation, as well as electronic distribution, to IMS attendees.
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Electronic Submission: Technical seminar proposals for presentation at this symposium must be submitted via email to microapps@ims2011.org. Please do not submit your proposal to MP Associates.
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Deadlines:
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Seminar Proposal Format: Seminar proposals (in English) must be submitted as one PDF
(Acrobat v6.0 or newer) formatted file which contains:
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Seminar Selection Criteria: Each registered IMS2011 Exhibitor is invited to submit MicroApps seminar proposals. All submissions and presentations must be in
English, and may cover new products, noteworthy state-of-the-art components, new technologies, manufacturing and design
techniques incorporating the Exhibitor's products and technologies. These submissions will be reviewed by the IMS2011 MicroApps
committee based on the abstract. Presentations are open to all IMS registrants and should appeal to the Exhibition attendees.
The selection criteria include relevance and interest to MTT-S members and the local microwave community, as well as being a
registered Exhibitor at IMS2011. The objective of MicroApps is to reach out to engineers new to a technical area and technicians. The
purpose of MicroApps is to communicate practical knowledge. Tutorials and application notes on basic techniques and tribal
knowledge are encouraged. Marketing, sales, or theoretical presentations are not appropriate for MicroApps. Presenters can
invite attendees to visit their exhibit for further discussion.
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Seminar Presentation Format: PowerPoint presentations with embedded movies are strongly encouraged. The presentations are made in the MicroApps theater which will be located on the exhibit floor. Advanced acoustics will be employed that permit everyone inside the theater to hear the presentation and Exhibitors outside to conduct normal business. Your company will be given the opportunity to invite people to hear your presentation using an "Exhibition Only" pass to IMS2011. Seminar presentations are typically 20 minutes in length. Time allocations for each presentation will be set by the review committee. Allotted presentation time may be reduced for multiple submissions from each Exhibitor. The file for the DVD should not exceed 30MB. The DVD is offered free of charge to all MicroApps attendees. Presentations should be by digital projection using the session PC and are due June 1, 2011. Recordings of the presentations may be made for distribution via restricted access website and/or DVD. |
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MicroApps Suggested Areas of Interest
(other topics will also be considered) |
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CAD and Modeling Products and Techniques
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1
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Design for Testability
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2
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Design for Manufacturability
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3
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System Design
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Mechanical and Passive Components
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4
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Transmission Lines
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5
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Filters and Multiplexers
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6
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Ferrite and Acoustic Components
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7
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Conventional Passive Devices
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8
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MEMS Components and Technologies
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Active Components
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9
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Digital and Mixed Signal Circuits
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10
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Oscillators and Frequency Sources
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11
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RF Power Devices and Amplifiers
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12
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Low-Noise Components and Receivers
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13
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Monolithic Microwave Integrated Circuits
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14
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New Semiconductor Technologies
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15
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Optoelectronics for microwave/mm-wave Applications
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16
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Superconducting Components and Technologies
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17
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Switches, Phase Shifters, Limiters, Mixers, Frequency Multipliers
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Sub-Assemblies
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18
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Hybrids and Modules
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19
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Microwave Systems
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20
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Wireless and Cellular Communications
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21
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Broadband Communications
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22
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Sensors and Sensor Systems
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23
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RFID
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Instrumentation and Measurement Techniques
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24
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Novel Testing Techniques
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25
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Assembly Test Techniques
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26
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Basic "Nuts and Bolts" Test Procedures
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27
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Wafer and Die RF Probe
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28
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Extreme Environments Evaluation
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Other
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29
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Packaging and Interconnects
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30
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Manufacturing Processes
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